Batch Processing in Control X
In previous Metrology Minutes, we have gone through Control X basic inspection processes and techniques but what about when we need to inspect more than one of the same parts or assemblies, utilizing the same inspection program (inspection plan)? That’s where Batch Processing in Control X comes in very handy. Completely unmanned, Control X can open successive files (scans or point clouds) in a folder or you can select from various files contained in several [...]