Metrology Minute – Batch Processing
Control X is a powerful metrology product with dozens of inspection tools available including; 2D and 3D dimensioning, GD&T analysis, color maps, Whisker plots, and many more. After all of the inspection tools are deployed for a specific inspection plan, you can create a date and time-stamped report, serialized for a particular part scan. This ensures that the inspection report of a single-part scan against a nominal CAD model is correctly identified and stored. But [...]